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Analysis of Curing Reaction for Epoxy Resin Used for Electrical Insulator: Two-stage Cure Reaction with a Finite Element Method

机译:电绝缘用环氧树脂固化反应分析:有限元法两步固化反应

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摘要

Epoxy has been used widely in electronic devices because of its excellent electrical properties for insulators. In epoxy resin curing reaction process, phenomena such as heat of reaction, reaction progress (degree of cure, physical properties, etc.), cure shrinkage and viscoelastic behavior, are related intricately.It is known that there are serious problems of delamination at the metal- epoxy resin interface and crack failure in epoxy resin due to cure shrinkage when epoxy resin is used as encapsulating medium of insulators in electrical and electronic equipments. It is very difficult to make experimentally clear the mechanism of the delamination and crack failure occurring in electrical and electronic equipments during curing reaction. Though several papers have been reported on the attempts to predict the stress-strain behavior during curing reaction, their simulation model is proposed under the conditions without cure shrinkage, heat of reaction, reaction progress, delamination or crack failure. Therefore, previous works cannot be always applied to the practical production process. In order to solve these problems, the authors have proposed a new simulation model, which can applies to the curing process from potting (liquid state) to gelling (solid state) under a constant curing temperature. In this work, the authors have attempted the simulation with a finite element method for two-stage cure reaction as follows:Epoxy resin was potted between the inner and outer iron cylinders. The potted epoxy resin was cured under a given temperature before gelling and under a higher temperature during gelling (two-stage cure reaction). In order to express the two-stage cure reaction, the equation of cure reaction was corrected. The circumferential strain curves on the surface of outer iron cylinder predicted by the simulation are in good agreement with the experimental results.
机译:环氧树脂由于其优异的绝缘性能,已广泛用于电子设备。在环氧树脂固化反应过程中,反应热,反应进程(固化程度,物理性质等),固化收缩率和粘弹性行为等现象之间存在着复杂的联系。当将环氧树脂用作电气和电子设备中的绝缘体的密封介质时,由于固化收缩导致金属-环氧树脂界面和环氧树脂的裂纹破坏。在实验上很难弄清固化反应过程中电气和电子设备中发生分层和裂纹破坏的机理。尽管已经报道了几篇有关预测固化反应过程中应力应变行为的尝试的论文,但它们的模拟模型是在没有固化收缩,反应热,反应进程,分层或裂纹破坏的条件下提出的。因此,先前的工作不能总是应用于实际的生产过程。为了解决这些问题,作者提出了一种新的仿真模型,该模型可以应用于在恒定固化温度下从灌封(液态)到胶凝(固态)的固化过程。在这项工作中,作者尝试使用有限元方法对两阶段固化反应进行模拟,如下所示:将环氧树脂灌入内铁缸和外铁缸之间。在胶凝之前,将给定的环氧树脂在给定的温度下固化,而在胶凝期间则在较高的温度下固化(两步固化反应)。为了表示两阶段固化反应,对固化反应方程进行了校正。通过仿真预测的外铁筒表面圆周应变曲线与实验结果吻合良好。

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